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Precision 304 Stainless Steel Three-Way Vacuum Chamber with Internal Channel Deburring and Electropolishing

We manufactured a precision 304 stainless steel three-way vacuum chamber for a semiconductor wafer fabrication application. This multi-port vacuum component features intersecting internal channels that create flow paths for gas distribution — presenting two critical manufacturing challenges: burr removal at cross-hole intersections and internal surface electropolishing for ultra-clean vacuum performance. Cross-drilled intersections in stainless steel are notorious for producing tenacious burrs that are difficult to access and remove, yet any residual burr can become a contamination source in semiconductor vacuum environments. We implemented specialized deburring tools combined with high-pressure flushing to access internal junctions, followed by controlled electropolishing parameters to achieve the required surface finish without over-etching or pitting. The result: vacuum-ready chambers meeting semiconductor industry cleanliness standards.

Project Overview

Project Name 304 Stainless Steel Three-Way Vacuum Chamber
Key Metric Specification
Internal Surface Condition Burr-free at all cross-hole intersections
Surface Treatment Electropolished internal surfaces
Dimensional Tolerance ±0.02mm (critical port and sealing features)
Material Stainless steel 304
Process CNC machining + TIG welding + electropolishing

Key Technical Highlights

  • Cross-Hole Burr Removal: Internal channel intersections were accessed using specialized right-angle and flexible-shaft deburring tools, followed by high-pressure flushing to ensure complete particle removal — critical for preventing contamination in vacuum applications.
  • Electropolishing Process Control: Vacuum electropolishing was applied to internal surfaces to remove the micro-rough layer, eliminate burrs, and create a smooth, non-porous surface. Research shows vacuum-assisted electropolishing reduces surface bubbles during the process, improving surface roughness and minimizing surface pitting [citation:3].
  • Weld Quality: All internal welds were full-penetration TIG welded and ground smooth before electropolishing — eliminating crevices that could trap process gases.

Quality Verification

Each chamber underwent borescope inspection for internal surface cleanliness and weld quality, surface roughness verification post-electropolishing, and helium leak testing to confirm vacuum integrity.

Industry Applications

Ideal for semiconductor wafer processing chambers, vacuum deposition systems, gas distribution manifolds, and high-purity vacuum assemblies.

Why Partner With Us?

  • Proven expertise in stainless steel vacuum component fabrication
  • In-house electropolishing and vacuum leak testing capabilities
  • Specialized techniques for cross-hole burr removal in confined geometries
  • 12+ years of precision manufacturing experience across semiconductor equipment sectors
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