We manufactured a precision 304 stainless steel three-way vacuum chamber for a semiconductor wafer fabrication application. This multi-port vacuum component features intersecting internal channels that create flow paths for gas distribution — presenting two critical manufacturing challenges: burr removal at cross-hole intersections and internal surface electropolishing for ultra-clean vacuum performance. Cross-drilled intersections in stainless steel are notorious for producing tenacious burrs that are difficult to access and remove, yet any residual burr can become a contamination source in semiconductor vacuum environments. We implemented specialized deburring tools combined with high-pressure flushing to access internal junctions, followed by controlled electropolishing parameters to achieve the required surface finish without over-etching or pitting. The result: vacuum-ready chambers meeting semiconductor industry cleanliness standards.
| Project Name | 304 Stainless Steel Three-Way Vacuum Chamber |
| Key Metric | Specification |
| Internal Surface Condition | Burr-free at all cross-hole intersections |
| Surface Treatment | Electropolished internal surfaces |
| Dimensional Tolerance | ±0.02mm (critical port and sealing features) |
| Material | Stainless steel 304 |
| Process | CNC machining + TIG welding + electropolishing |
Each chamber underwent borescope inspection for internal surface cleanliness and weld quality, surface roughness verification post-electropolishing, and helium leak testing to confirm vacuum integrity.
Ideal for semiconductor wafer processing chambers, vacuum deposition systems, gas distribution manifolds, and high-purity vacuum assemblies.
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